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DAOS-14725 tests: avoid DER_EBUSY when test teardown #13596

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Jan 23, 2024
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7 changes: 5 additions & 2 deletions src/tests/suite/daos_base_tx.c
Original file line number Diff line number Diff line change
Expand Up @@ -704,6 +704,9 @@ dtx_resend_delay(test_arg_t *arg, daos_oclass_id_t oclass)
daos_fail_loc_set(0);
dtx_set_fail_loc(arg, 0);

/* Wait for the former delayed RPC before destroying the container to avoid DER_BUSY. */
sleep(2);

D_FREE(update_buf);
D_FREE(fetch_buf);
ioreq_fini(&req);
Expand Down Expand Up @@ -941,9 +944,9 @@ static const struct CMUnitTest dtx_tests[] = {
{"DTX19: DTX resend during bulk data transfer - multiple reps",
dtx_19, NULL, test_case_teardown},
{"DTX20: race between DTX refresh and DTX resync",
dtx_20, dtx_base_rf1_setup, test_case_teardown},
dtx_20, dtx_base_rf1_setup, rebuild_sub_teardown},
{"DTX21: do not abort partially committed DTX",
dtx_21, dtx_base_rf0_setup, test_case_teardown},
dtx_21, dtx_base_rf0_setup, rebuild_sub_teardown},
};

static int
Expand Down
3 changes: 1 addition & 2 deletions src/tests/suite/daos_verify_consistency.c
Original file line number Diff line number Diff line change
Expand Up @@ -352,8 +352,7 @@ vc_9(void **state)
oid = daos_test_oid_gen(arg->coh, dts_vc_class, 0, 0, arg->myrank);
ioreq_init(&req, arg->coh, oid, DAOS_IOD_ARRAY, arg);

vc_gen_modifications(arg, &req, oid, 7, 7, 7,
DAOS_VC_DIFF_DKEY, 0, 0);
vc_gen_modifications(arg, &req, oid, 7, 7, 7, DAOS_VC_DIFF_DKEY | DAOS_FAIL_ALWAYS, 0, 0);

rc = vc_obj_verify(arg, oid);
assert_rc_equal(rc, -DER_MISMATCH);
Expand Down